Browsing Computer Vision & Pattern Recognition 301 - 320 of 6699 results

  • eBook
    27th International Conference, ICPR 2024, Kolkata, India, December 1–5, 2024, Proceedings, Part XXI
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    27th International Conference, ICPR 2024, Kolkata, India, December 1–5, 2024, Proceedings, Part VII
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    8th IFIP TC 12 International Conference, ICCCSP 2024, Chennai, India, March 20-22, 2024, Revised Selected Papers
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    9th International Symposium, SG 2008, Rennes, France, August 27-29, 2008, Proceedings
    • 1st Edition
    • Andreas Butz; Brian Fisher; Antonio Kruger
    • Springer
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    4th International Conference, CompIMAGE 2014, Pittsburgh, PA, USA, September 3-5, 2014, Proceedings
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    A Practical Introduction and Survival Guide
    • Oleg S. Pianykh
    • Springer
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    • Author
    • Springer
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    International Evaluation Workshops CLEAR 2007 and RT 2007, Baltimore, MD, USA, May 8-11, 2007, Revised Selected Papers
    • 1st Edition
    • Rainer Stiefelhagen; ‎Rachel Bowers; ‎Jonathan Fiscus
    • Springer
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    Scientific Visualization and Imaging Systems
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    9th International Conference, MCSS 2017, Kraków, Poland, November 16-17, 2017, Proceedings
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    • 1st Edition
    • B. V. K. Vijaya Kumar; Abhijit Mahalanobis; Richard D. Juday
    • Cambridge University Press
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    • Springer
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    21st International Symposium, SPIRE 2014, Ouro Preto, Brazil, October 20-22, 2014, Proceedings
    • Springer
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    Signalerkennung
    • 2nd Edition
    • Rüdiger Hoffmann; Matthias Wolff
    • Springer Vieweg
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    4th International Workshop, BrainLes 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16, 2018, Revised Selected Papers, Part I
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    • Shiliang Sun; Liang Mao; Ziang Dong; Lidan Wu
    • Springer
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    14th International Conference, KES 2010, Cardiff, UK, September 8-10, 2010, Proceedings, Part IV
    • 1st Edition
    • Rossitza Setchi; ‎Ivan Jordanov
    • Springer
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    Second International Workshop, GRAIL 2018 and First International Workshop, Beyond MIC 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 20, 2018, Proceedings
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    4th European Summit, EiED 2014, Vienna, Austria, November 24-26, 2014, Revised Selected Papers
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    Accurate Material Appearance Measurement, Representation and Modeling
    • Michal Haindl; Jiri Filip
    • Springer
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