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  • eBook
    • 1st Edition
    • River Publishers
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    Volume I
    • Springer
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    • Tingzhao Fu
    • Springer
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    Proceedings of SCSS 2005
    • 1st Edition
    • Tarek Sobh; ‎Khaled Elleithy
    • Springer
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    • Yuriy Shmaliy
    • Springer
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    Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
    • 1st Edition
    • Zofia Lukszo; ‎Geert Deconinck; ‎Margot P. C. Weijnen
    • Springer
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    • Author
    • Springer
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    • Slobodan N. Vukosavic
    • Springer
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    Addressing Technological Challenges of Large-Scale Detectors
    • Michael Schenk
    • Springer Spektrum
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    • 2nd Edition
    • Patrick R. Schaumont
    • Springer
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    Aufbau, Funktion, Eigenschaften, Dimensionierung und Anwendung
    • 3rd Edition
    • Leonhard Stiny
    • Springer Vieweg
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    • Mohammad Farazian; Lawrence E. Larson; Prasad S. Gudem
    • Springer
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    • 1st Edition
    • E. Macii
    • Springer
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    Technology Advancement and Application Demonstrations
    • 1st Edition
    • Yongpan Liu; ‎YounLong Lin; ‎ChongMin Kyung
    • Springer
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    Defects, Fault Models and Test Patterns
    • Said Hamdioui
    • Springer
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    • Zhicheng Lin; Pui-In Mak (Elvis); Rui Paulo Martins
    • Springer
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    24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
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    • Springer
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    • Bogdan Alexandru Dumitrescu
    • Springer
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    • Francisco Serra-Graells; Adoración Rueda; José L. Huertas
    • Springer
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    From Scopes and Probes to Timing and Jitter
    • Wolfgang Maichen
    • Springer
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