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Cover image: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies 9781402083624

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

  • Author(s) Andrei Pavlov; Manoj Sachdev
  • Publisher Published by Springer Copyright © 2008
  • ISBN-13 9781402083624
  • Format Fixed Layout

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test is written by Andrei Pavlov; Manoj Sachdev and published by Springer. The Digital and eTextbook ISBNs for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies are 9781402083631, 1402083637 and the print ISBNs are 9781402083624, 1402083629. Save up to 80% versus print by going digital with VitalSource.

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