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  • eBook
    • 1st Edition
    • J. Chinal
    • De Gruyter
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    • 1st Edition
    • CRC Press
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    • Ahmed Helmy; Mohammed Ismail
    • Springer
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    AISEM 2010 Proceedings
    • Giovanni Neri
    • Springer
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    • Ting Li
    • Springer
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    • Springer
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    • Ken Kundert; Olaf Zinke
    • Springer
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    Technologies and Trends
    • Betty Prince
    • Springer
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    Modeling and Emulation
    • Maria Carmela Di Piazza; Gianpaolo Vitale
    • Springer
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    • R. K. Rao Yarlagadda
    • Springer
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    • Karabi Biswas; Gary Bohannan; Riccardo Caponetto; António Mendes Lopes; José António Tenreiro Machad
    • Springer
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    Fehlerphysik, Ausfallmechanismen, Prüffeldpraxis, Qualitätsüberwachung
    • Titu-Marius I. Băjenescu
    • Springer Vieweg
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    Select Proceedings of ICNETS2, Volume V
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    • Springer
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    • Majid Sarrafzadeh; Maogang Wang; Xianjian Yang
    • Springer
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    • Vincent S. L. Cheung; Howard Cam H. Luong
    • Springer
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    Negative-feedback amplifiers
    • Chris J.M. Verhoeven; Arie van Staveren; G.L.E. Monna; M.H.L. Kouwenhoven; E. Yildiz
    • Springer
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    Starting at:$64.32 CAD

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    Selected papers from FDL 2005
    • 1st Edition
    • A. Vachoux
    • Springer
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    • Alireza Zolfaghari
    • Springer
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    • Lei Wang; Man-Chung Wong; Chi-Seng Lam
    • Springer
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    Implants, Properties, and Device Fabrication
    • Saurabh Nagar; Subhananda Chakrabarti
    • Springer
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