Electromigration in Thin Films and Electronic Devices: Materials And Reliability

Cover image: Electromigration in Thin Films and Electronic Devices: Materials And Reliability 9781845699376
  • Author(s)
    Kim, C-U
  • Publisher
    Woodhead Publishing
  • Format
    Reflowable Layout
  • Print ISBN 9781845699376, 1845699378
  • eText ISBN 9780857093752
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Electromigration in Thin Films and Electronic Devices: Materials And Reliability is written by Kim, C-U and published by Woodhead Publishing. The Digital and eTextbook ISBNs for Electromigration in Thin Films and Electronic Devices: Materials And Reliability are 9780857093752 and the print ISBNs are 9781845699376, 1845699378. Save up to 80% versus print by going digital with VitalSource.

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