Electronics Reliability and Measurement Technology: Nondestructive Evaluation

Cover image: Electronics Reliability and Measurement Technology: Nondestructive Evaluation 9780815511717
  • Author(s)
    Heyman, Joseph S.
  • Publisher
    William Andrew Publishing
  • Format
    Fixed Layout
  • Print ISBN 9780815511717, 081551171X
  • eText ISBN 9780815511717, 9780815517009, 0815517009
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Electronics Reliability and Measurement Technology: Nondestructive Evaluation is written by Heyman, Joseph S. and published by William Andrew Publishing. The Digital and eTextbook ISBNs for Electronics Reliability and Measurement Technology: Nondestructive Evaluation are 9780815511717, 9780815517009, 0815517009 and the print ISBNs are 9780815511717, 081551171X. Save up to 80% versus print by going digital with VitalSource.

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