Power-Constrained Testing of VLSI Circuits
A Guide to the IEEE 1149.4 Test Standard

Cover image: Power-Constrained Testing of VLSI Circuits 9781402072352
  • Author(s)
    Nicola Nicolici; Bashir M. Al-Hashimi
  • Publisher
    Springer
  • Format
    Fixed Layout
  • Print ISBN 9781402072352, 140207235X
  • eText ISBN 9780306487316, 0306487314
  • Copyright
    2003
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard is written by Nicola Nicolici; Bashir M. Al-Hashimi and published by Springer. The Digital and eTextbook ISBNs for Power-Constrained Testing of VLSI Circuits are 9780306487316, 0306487314 and the print ISBNs are 9781402072352, 140207235X. Save up to 80% versus print by going digital with VitalSource.

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