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Cover image: Power-Constrained Testing of VLSI Circuits 9781402072352

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

  • Author(s) Nicola Nicolici; Bashir M. Al-Hashimi
  • Publisher Published by Springer Copyright © 2003
  • ISBN-13 9781402072352
  • Format Fixed Layout

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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard is written by Nicola Nicolici; Bashir M. Al-Hashimi and published by Springer. The Digital and eTextbook ISBNs for Power-Constrained Testing of VLSI Circuits are 9780306487316, 0306487314 and the print ISBNs are 9781402072352, 140207235X. Save up to 80% versus print by going digital with VitalSource.

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