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Browsing Measurement 401 - 420 of 1079 results

  • eBook
    Proceedings of the International Conference SEFI 2000, Paris, France, 6-8 September 2000
    • 1st Edition
    • Jean Michel
    • CRC Press
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    • V. Jagadeesh Kumar
    • Springer
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    Based on a Disappearing-Track Signature in pp Collisions at √s = 8 TeV
    • Shingo Kazama
    • Springer
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    Starting at:₹2,352.82 INRPrice includes GST

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    • 1st Edition
    • Horia Mihai Moțit
    • CRC Press
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    Sensors and Measuring Systems for Nanomanufacturing
    • Wei Gao
    • Springer
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    • Zvi Rosenberg; Erez Dekel
    • Springer
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    • 2nd Edition
    • T. Stewart McKechnie
    • Springer
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    • Marco Vignati
    • Springer
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    • 1st Edition
    • Je-Chin Han; Lesley Wright
    • CRC Press
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    • 6th Edition
    • Dirk Werner
    • Springer
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    • 2nd Edition
    • Valery A. Slaev; Anna G. Chunovkina; Leonid A. Mironovsky
    • De Gruyter
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    • 1st Edition
    • P.S. Bulson
    • CRC Press
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    • Matthew R. Foreman
    • Springer
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    • 2nd Edition
    • Michael Bukshtab
    • Springer
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    • 1st Edition
    • Ichiko Misumi
    • IOP Publishing (Institute of Physics)
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    A Second Workshop on the Nature of the High-Energy Unidentified Sources
    • 1st Edition
    • K.S. Cheng; ‎Gustavo E. Romero
    • Springer
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    • 2nd Edition
    • Frank Fahy
    • CRC Press
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    Multiwavelength Point of View
    • Tsutomu T. Takeuchi
    • Springer
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    An Introduction
    • Bryan H. Suits
    • Springer
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    Grundlagen und Anwendungen
    • 2nd Edition
    • Hermann Kolanoski; Norbert Wermes
    • Springer Spektrum
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