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Cover image: Testing Static Random Access Memories 9781402077524

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

  • Author(s) Said Hamdioui
  • Publisher Published by Springer Copyright © 2004
  • "ISBN-13 9781402077524"
  • Format Fixed Layout

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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns is written by Said Hamdioui and published by Springer. The Digital and eTextbook ISBNs for Testing Static Random Access Memories are 9781475767063, 1475767064 and the print ISBNs are 9781402077524, 1402077521. Save up to 80% versus print by going digital with VitalSource. Additional ISBNs for this eTextbook include 9781441954305.

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