The Physics of SiO2 and Its Interfaces
Proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24, 1978

Cover image: The Physics of SiO2 and Its Interfaces 9780080230498
eTextbook License
$129.72 NZD

  • Study Tools

    Built-in study tools like highlights and more

  • Read Aloud

    Listen and follow along as Bookshelf reads to you

  • Offline Access

    Access your eTextbook anytime and anywhere

Learn More

VitalSource 25+ Years of Digital Transformation

  • 4500 Institutions

  • 230+ Countries & Territories

  • 10K+ Publishers

  • 18M+ Active Users