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Cover image: Electromigration in Thin Films and Electronic Devices: Materials And Reliability 9781845699376

Electromigration in Thin Films and Electronic Devices: Materials And Reliability

  • Author(s) Kim, C-U
  • Publisher Published by Woodhead Publishing
  • "ISBN-13 9781845699376"
  • Format Reflowable Layout

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Electromigration in Thin Films and Electronic Devices: Materials And Reliability is written by Kim, C-U and published by Woodhead Publishing. The Digital and eTextbook ISBNs for Electromigration in Thin Films and Electronic Devices: Materials And Reliability are 9780857093752 and the print ISBNs are 9781845699376, 1845699378. Save up to 80% versus print by going digital with VitalSource.

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