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Cover image: Reliability Prediction for Microelectronics 1st edition 9781394210930

Reliability Prediction for Microelectronics

1st Edition

  • Author(s) Joseph B. Bernstein; Alain Bensoussan; Emmanuel Bender
  • Publisher Published by John Wiley & Sons P&T Copyright © 2024
  • "ISBN-13 9781394210930"
  • Format Reflowable Layout

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Reliability Prediction for Microelectronics 1st Edition is written by Joseph B. Bernstein; Alain Bensoussan; Emmanuel Bender and published by John Wiley & Sons P&T. The Digital and eTextbook ISBNs for Reliability Prediction for Microelectronics are 9781394210954, 1394210957 and the print ISBNs are 9781394210930, 1394210930. Save up to 80% versus print by going digital with VitalSource. Additional ISBNs for this eTextbook include 9781394210961.

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