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  • eBook
    • 1st Edition
    • Alberto Menéndez Martínez
    • TebarFlores
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    Physik, Eigenschaften, Zuverlässigkeit
    • Josef Lutz
    • Springer
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    Results of the 12th International Conference
    • Springer
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    • Yongquan Fan; Zeljko Zilic
    • Springer
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    Select Proceedings of AECSS 2019
    • 1st Edition
    • Gayadhar Pradhan; Stella Morris; Niranjan Nayak
    • Springer
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    Design-Analyse - Interpretation der Normen - Bewertung der Prüfergebnisse
    • 3rd Edition
    • Dieter Stotz
    • Springer Vieweg
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    • Karl-Heinz Gonschorek
    • Springer
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    • Kin P. Cheung
    • Springer
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    An Introduction
    • 8th Edition
    • Karlheinz Seeger
    • Springer
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    • Paul Leroux; Michiel Steyaert
    • Springer
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    IFIP TC10 / WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC’01) December 3–5, 2001, Montpellier, France
    • 1st Edition
    • Michel Robert; Bruno Rouzeyre; Christian Piguet
    • Springer
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    Basics and Use for Evaluating Electronic Devices and Materials
    • Otwin Breitenstein; Wilhelm Warta; Martin Langenkamp
    • Springer
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    Halbleiterbauelemente und deren Anwendung in elektronischen Schaltungen
    • Thomas Tille; Doris Schmitt-Landsiedel
    • Springer
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    • Sid Katzen
    • Springer
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    • Jad G. Atallah; Mohammed Ismail
    • Springer
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    All about Instruments: From Trundle Wheels to Atomic Clocks
    • Alex Hebra
    • Springer
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    • 2nd Edition
    • Eduardo F. Camacho; Carlos Bordons Alba
    • Springer
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    • Vijay Madisetti; Chonlameth Arpnikanondt
    • Springer
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    • Adrian Bejan; Ibrahim Dincer; Sylvie Lorente; Antonio Miguel; Heitor Reis
    • Springer
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    Zukunftsszenarien
    • 1st Edition
    • Alfons Botthof; Joachim Pelka
    • Springer
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    Starting at:R227.06 ZARPrice includes VAT

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