Browsing Measurement 861 - 880 of 1105 results

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    • Jiaguo Lu; Wei Wang; Xiaolu Wang; Yongxin Guo
    • Springer
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    esign Approaches,Testing and L
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    • Edward R. Generazio
    • CRC Press
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    Probing the traps in field-effect transistors
    • Seongil Im; Youn-Gyoung Chang; Jae Hoon Kim
    • Springer
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    Applications in Fat and Oil Technology
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    • CRC Press
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    Static and dynamic x-ray fluorescence for chemical element identification
    • Kenji Sakurai; Wenyang Zhao
    • Institute of Physics Publishing
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    • 1st Edition
    • James Randa
    • Wiley-Blackwell
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    • 1st Edition
    • Ron Patton; Robert N. Clark; Paul M. Frank
    • Springer
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    • 1st Edition
    • Alaa El-Din A. Bekhit
    • CRC Press
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    • EPA
    • William Andrew Publishing
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    Industrial Application Issues
    • Springer
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    Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung
    • Jürgen Beyerer; Fernando Puente León; Christian Frese
    • Springer
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    Selected Papers from the 9th International Symposium Lisbon, Portugal, July 13–16, 1998
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    • R.J. Adrian; D.F.G. Durao; F. Durst; M.V. Heitor
    • Springer
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    Versatile Particle Detectors for High-Rate Applications
    • Jonathan Bortfeldt
    • Springer
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    Past, Present and Future. International System of Units
    • S. V. Gupta
    • Springer
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    Enhancing System Performance through Operations, Measurement, and Verification
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    • Michael Ginsberg
    • Routledge
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    • Author
    • Springer
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    Advanced Applications - Bragg Gratings and Distributed Sensors
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    • L.S. Grattan; ‎B.T. Meggitt
    • Springer
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    Volume 1
    • 1st Edition
    • Vincenzo Levizzani; Christopher Kidd; Dalia B. Kirschbaum
    • Springer
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    • Giovanni Organtini
    • Springer
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    • 1st Edition
    • Seizo Morita; Roland Wiesendanger; E. Meyer
    • Springer
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