Bladeren door Computer Vision & Pattern Recognition 421 - 440 van 7049 resultaten

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    19th International Conference, Inscrypt 2023, Hangzhou, China, December 9–10, 2023, Revised Selected Papers, Part I
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    Technology and Applications
    • 1st Editie
    • Chapman & Hall
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    5th International Conference, AIST 2023, Delhi, India, December 26–27, 2023, Proceedings, Part I
    • Amita Dev, Arun Sharma, S. S. Agrawal, Ritu Rani
    • Springer
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    • IGI Global
    • Engineering Science Reference
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    European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VII
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    Survey of Missions and Sensors
    • 4th Editie
    • Herbert J. Kramer
    • Springer
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    11th International Conference of the CLEF Association, CLEF 2020, Thessaloniki, Greece, September 22–25, 2020, Proceedings
    • 1st Editie
    • Avi Arampatzis; Evangelos Kanoulas; Theodora Tsikrika
    • Springer
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    19th International Conference, EANN 2018, Bristol, UK, September 3-5, 2018, Proceedings
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    Third International Conference on Data Science, Medicine, and Bioinformatics, IDMB 2019, Nanning, China, June 22–24, 2019, Revised Selected Papers
    • 1st Editie
    • Fei Han; ‎Henry Han; ‎Tie Wei
    • Springer
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    12th Latin American Robotics Symposium and Third Brazilian Symposium on Robotics, LARS 2015/SBR 2015, Uberlândia, Brazil, October 28 - November 1, 2015, Revised Selected Papers
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    Chinese Conference, IGTA 2014, Beijing, China, June 19-20, 2014. Proceedings
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    18th International Conference, HCI International 2016 Toronto, Canada, July 17–22, 2016 Proceedings, Part II
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    • Gang Xiao; Durga Prasad Bavirisetti; Gang Liu; Xingchen Zhang
    • Springer
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    A Multidisciplinary Approach to an Emerging Information Technology
    • Springer
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    7th International Conference, HIS 2018, Cairns, QLD, Australia, October 5–7, 2018, Proceedings
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    4th European Summit, EiED 2014, Vienna, Austria, November 24-26, 2014, Revised Selected Papers
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    Algorithms, Routines and Applications
    • Wojciech Wieczorek
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    7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II
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    First International Workshop, COMPAY 2018, and 5th International Workshop, OMIA 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16 - 20, 2018, Proceedings
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    Accurate Material Appearance Measurement, Representation and Modeling
    • Michal Haindl; Jiri Filip
    • Springer
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