Cover image: Nanometer-scale Defect Detection Using Polarized Light 1st edition 9781848219366

Nanometer-scale Defect Detection Using Polarized Light

1st Edition

  • Author(s) Pierre-Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami
  • Publisher Published by Wiley-ISTE Copyright © 2016
  • "ISBN-13 9781848219366"
  • Format Reflowable Layout

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$142.00 USD
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Nanometer-scale Defect Detection Using Polarized Light 1st Edition is written by Pierre-Richard Dahoo; Philippe Pougnet; Abdelkhalak El Hami and published by Wiley-ISTE. The Digital and eTextbook ISBNs for Nanometer-scale Defect Detection Using Polarized Light are 9781119329688, 111932968X and the print ISBNs are 9781848219366, 1848219369. Save up to 80% versus print by going digital with VitalSource. Additional ISBNs for this eTextbook include 9781119329633.

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