Cover image: New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices 9780323241434

New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

  • Author(s) Zalevsky, Zeev; Livshits, Pavel; Gur, Eran
  • Publisher Published by William Andrew Publishing
  • "ISBN-13 9780323241434"
  • Format Reflowable Layout

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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices is written by Zalevsky, Zeev; Livshits, Pavel; Gur, Eran and published by William Andrew Publishing. The Digital and eTextbook ISBNs for New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices are 9780128000175 and the print ISBNs are 9780323241434, 0323241433. Save up to 80% versus print by going digital with VitalSource.

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