Cover image: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance 9783319005898

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

  • Author(s) Kipp van Schooten
  • Publisher Published by Springer Copyright © 2013
  • "ISBN-13 9783319005898"
  • Format Reflowable Layout

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Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance is written by Kipp van Schooten and published by Springer. The Digital and eTextbook ISBNs for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance are 9783319005904, 3319005901 and the print ISBNs are 9783319005898, 3319005898. Save up to 80% versus print by going digital with VitalSource.

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