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VLSI-SoC: Design for Reliability, Security, and Low Power

23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

By: Youngsoo Shin

  • Publisher:  Springer
  • Print ISBN: 9783319460970, 3319460978

  • eText ISBN: 9783319460970, 3319460978

  • Copyright year: 2016
  • Format: Reflowable
Available from ﷼‎ 128.10 SAR
SKU: 9783319460970R30
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