Browsing Spectroscopy & Spectrum Analysis 401 - 420 of 1896 results

  • eBook
    Diffraction, Imaging, and Spectrometry
    • Springer
    • Reflowable Layout

    Starting at:$27.00 USD

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  • eBook
    • Rachel Pflieger; Sergey I. Nikitenko; Carlos Cairós; Robert Mettin
    • Springer
    • Reflowable Layout

    Starting at:$18.00 USD

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  • eBook
    Measurement Methods and Result Evaluations
    • László Tolvaj
    • Springer
    • Reflowable Layout

    Starting at:$21.00 USD

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  • eBook
    Mehrgrößensysteme, Digitale Regelung
    • 4th Edition
    • Jan Lunze
    • Springer
    • Fixed Layout

    Starting at:$16.50 USD

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  • eBook
    • Veronika Sunko
    • Springer
    • Reflowable Layout

    Starting at:$29.70 USD

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  • eBook
    Basic Techniques and Methods
    • Priti Malhotra
    • Springer
    • Reflowable Layout

    Starting at:$27.00 USD

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  • eBook
    • Yasuhiro Iwasawa
    • Springer
    • Fixed Layout

    Starting at:$62.70 USD

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  • eBook
    An Illustrated Introduction
    • 1st Edition
    • Iulian Ionita
    • CRC Press
    • Reflowable Layout

    Starting at:$53.35 USD

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  • eBook
    • 4th Edition
    • Harald Friedrich
    • Springer
    • Reflowable Layout

    Starting at:$26.70 USD

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  • eBook
    • Academic Press
    • Reflowable Layout

    $256.00 USD

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  • eBook
    • Sharona Cohen
    • Springer
    • Fixed Layout

    Starting at:$26.70 USD

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  • eBook
    • Springer
    • Reflowable Layout

    Starting at:$53.70 USD

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  • eBook
    • 1st Edition
    • William S. Price
    • Academic Press
    • Reflowable Layout

    $256.00 USD

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  • eBook
    • Author
    • Springer
    • Reflowable Layout

    Starting at:$50.70 USD

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  • eBook
    • Francois Hammer; Mathieu Peuch; Hector Flores; Myriam Rodrigues
    • World Scientific
    • Reflowable Layout

    $47.00 USD

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  • eBook
    Theory, Experiments, and Applications, Second Edition
    • 2nd Edition
    • Jozef Kowalewski; Lena Maler
    • CRC Press
    • Reflowable Layout

    Starting at:$37.40 USD

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  • eBook
    • Springer
    • Reflowable Layout

    Starting at:$50.70 USD

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  • eBook
    • 2nd Edition
    • David A. Cremers; Leon J. Radziemski
    • Wiley-Blackwell
    • Reflowable Layout

    $136.00 USD

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  • eBook
    A Method of Defect Characterization in Silicon for Photovoltaic Applications
    • Stefan Rein
    • Springer
    • Fixed Layout

    Starting at:$95.70 USD

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  • eBook
    • 1st Edition
    • Edward Sacher
    • Springer
    • Reflowable Layout

    Starting at:$29.70 USD

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